Standard

IEC 61967-8:2011 ED1

Aug 2011 Revised

Note: Latest version: IEC 61967-8:2023 ED2

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Language English/French

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Abstract

IEC 61967-8:2011 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement. This publication is to be read in conjunction with IEC 61967-1:2002.

Products specifications

Standard from IEC
Published: August 11 2011
Withdrawn: May 3 2023
Edition: 1
Document type: IS
Pages
ISBN: 9782889126194

Publisher: IEC
Distributor: IEC
ICS: 31.200
International TC: TC 47/SC 47A

Product Relations

Revised by: IEC 61967-8:2023 ED2
Adopted by: NF EN 61967-8:2012

IEC 61967-8:2011 ED1

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IEC 61967-8:2023 ED2