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IEC 61967-4:2002 ED1

Apr 2002 Revised

Note: Latest version: IEC 61967-4:2021 ED2

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Corrigendum 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 Ω/150 Ω direct coupling method Revised IEC 61967-4:2002/COR1:2017 ED1 Corrigendum from Publication date: Jun 2017 Language: English/French Services: Online, Online + Pdf
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Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method Revised IEC 61967-4:2002/AMD1:2006 ED1 Amendment from Publication date: Feb 2006 Pages: 13 Language: English/French Services: Online, Online + Pdf

Abstract

Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements. The contents of the corrigendum 1 of June 2017 have been included in this copy.

Products specifications

Standard from IEC
Published: April 30 2002
Withdrawn: March 16 2021
Edition: 1
Document type: IS
Pages
ISBN: 2831863015

Publisher: IEC
Distributor: IEC
ICS: 31.200
International TC: TC 47/SC 47A

Product Relations

Revised by: IEC 61967-4:2021 ED2
Revised by: IEC 61967-4:2021 RLV
Adopted by: NF EN 61967-4:2002

IEC 61967-4:2002 ED1

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IEC 61967-4:2002+AMD1:2006 CSV ED1.1