Standard

IEC 61967-4:2002+AMD1:2006 CSV ED1.1

Jul 2006 Revised

Note: Latest version: IEC 61967-4:2021 ED2

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Abstract

Specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods guarantee a high degree of repeatability and correlation of EME measurements. IEC 61967-1 specifies general conditions and definitions of the test methods. The contents of the corrigendum 1 of June 2017 have been included in this copy. This consolidated version consists of the first edition (2002) and its amendment 1 (2006). Therefore, no need to order amendment in addition to this publication.

Products specifications

Standard from IEC
Published: July 27 2006
Withdrawn: March 16 2021
Edition: 1.1
Document type: IS
Pages
ISBN:

Publisher: IEC
Distributor: IEC
ICS: 31.200
International TC: TC 47/SC 47A

Product Relations

Revised by: IEC 61967-4:2021 ED2
Revised by: IEC 61967-4:2021 RLV

IEC 61967-4:2002+AMD1:2006 CSV ED1.1

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IEC 61967-4:2021 ED2