Search scope:
Shopping cart (0)
Redline

IEC 61788-7:2020 RLV

Current

Note: Latest version: IEC 61788-7:2020 ED3

Preview

Existing or new amendments and versions must be purchased separately.

Language
Services

Abstract

IEC 61788-7:2020 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition. IEC 61788-7:2020 describes measurement of the surface resistance (Rs) of superconductors at microwave frequencies by the standard two-resonator method. The object of measurement is the temperature dependence of Rs at the resonant frequency. The applicable measurement range of Rs for this method is as follows: - Frequency: 8 GHz - Measurement resolution: 0,01 m Ω at 10 GHz The Rs data at the measured frequency, and that scaled to 10 GHz, assuming the f 2 rule for comparison, is reported. This third edition cancels and replaces the second edition, published in 2006. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) informative Annex B, relative combined standard uncertainty for surface resistance measurement has been added; b) precision and accuracy statements have been converted to uncertainty; c) reproducibility in surface resistant measurement has been added.

Products specifications

  • Redline from IEC
  • Published:
  • Edition: 3
  • Document type: IS
  • Pages
  • Publisher: IEC
  • Distributor: IEC
  • ICS: 29.050
  • ICS: 17.220.20
  • International TC: TC 90

Product Relations

Product life cycle