Standard

IEC 61726:1999 ED2

Nov 1999 Revised

Note: Latest version: IEC 61726:2022 ED4

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Language English English/French

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Abstract

Describes the measurement of screening attenuation by the reverberation, or stirred, chamber, suitable for virtually any type of microwave component and having no theoretical upper frequency limit. It is only limited toward low frequencies due to the size of the test equipment, which is frequency dependent and is only one of several methods of measuring sreening attenuation. For the purpose of this standard, examples of microwave components are waveguides, phase shifters, diplexers/multiplexers, power dividers/combiners, etc.

Products specifications

Standard from IEC
Published: November 30 1999
Withdrawn: September 8 2015
Edition: 2
Document type: IS
Pages
ISBN: 283185038X

Publisher: IEC
Distributor: IEC
ICS: 33.120.10
ICS: 33.120.30
International TC: TC 46/SC 46A

Product Relations

Revised by: IEC 61726:2015 ED3
Replaces: IEC TR 61726:1995 ED1

IEC 61726:1999 ED2

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IEC 61726:2022 ED4

IEC 61726:2015 ED3