IEC 61445:2012 ED1


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IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following: a) UUT Model; b) Stimulus and Response; c) Fault Dictionary; d) Probe.

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  • Standard from IEEE
  • Published:
  • Edition: 1
  • Document type: IS
  • Pages
  • Publisher: IEEE
  • Distributor: IEEE
  • ICS: 25.040.01
  • ICS: 35.060
  • International TC: TC 91