Standard

IEC 61338-1-5:2015 ED1

Jun 2015 Current

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Abstract

IEC 61338-1-5:2015 describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate, which are called interface resistance and interface conductivity. This first edition cancels and replaces IEC PAS 61338-1-5 published in 2010. This edition includes the following significant technical changes with respect to the previous edition: a) description of technical content related to patents (Japanese patent numbers JP3634966, JP3735501) in the Introduction; b) changes to normative references; c)addition to bibliography.

Products specifications

Standard from IEC
Published: June 25 2015
Edition: 1
Document type: IS
Pages
ISBN: 9782832227213

Publisher: IEC
Distributor: IEC
ICS: 31.140
International TC: TC 49

Product Relations

Replaces: IEC PAS 61338-1-5:2010 ED1

IEC 61338-1-5:2015 ED1

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