Consolidated

IEC 60749-32:2002+AMD1:2010 CSV

Nov 2010 Current

Existing or new amendments and versions must be purchased separately.

Language English/French

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Abstract

IEC 60749-32:2002+A1:2010 is applicable to semiconductor devices (discrete devices and integrated circuits). The object of this test is to determine whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device. This consolidated version consists of the first edition (2002) and its amendment 1 (2010). Therefore, no need to order amendment in addition to this publication.

Products specifications

Consolidated from IEC
Published: November 29 2010
Edition: 1.1
Document type: IS
Pages
ISBN: 9782889122349

Publisher: IEC
Distributor: IEC
ICS: 31.080.01
International TC: TC 47

IEC 60749-32:2002+AMD1:2010 CSV

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