Standard

IEC 60749-26:2006 ED2

Jul 2006 Revised

Note: Latest version: IEC 60749-26:2018 ED4

Existing or new amendments and versions must be purchased separately.

Language English/French

Services Online + Pdf CHF 84.00 Online CHF 72.00

There are no extended editions available for this standard

There are no available corrigendum or amendments for this standard. Any future corrigendum and amendments will be added automatically for subscribers.

Abstract

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable HBM ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive.

Products specifications

Standard from IEC
Published: July 18 2006
Withdrawn: April 23 2013
Edition: 2
Document type: IS
Pages
ISBN: 2831887151

Publisher: IEC
Distributor: IEC
ICS: 31.080.01
International TC: TC 47

Product Relations

Revised by: IEC 60749-26:2013 ED3
Revises: IEC 60749-26:2003 ED1

IEC 60749-26:2006 ED2

Create subscription

IEC 60749-26:2018 ED4

IEC 60749-26:2013 ED3