Standard

IEC 60749-26:2003 ED1

Oct 2003 Revised

Note: Latest version: IEC 60749-26:2018 ED4

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Abstract

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model electrostatic discharge. The objective is to provide reliable, repeatable test results so that accurate classifications can be performed. The testing shall be selected from this test method or the machine model test method (see IEC 60749-27).

Products specifications

Standard from IEC
Published: October 21 2003
Withdrawn: July 18 2006
Edition: 1
Document type: IS
Pages
ISBN: 2831872219

Publisher: IEC
Distributor: IEC
ICS: 31.080.01
International TC: TC 47

Product Relations

Revised by: IEC 60749-26:2006 ED2
Replaces: IEC PAS 62179:2000 ED1

IEC 60749-26:2003 ED1

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IEC 60749-26:2018 ED4

IEC 60749-26:2013 ED3

IEC 60749-26:2006 ED2