Standard

IEC 60749-18:2002 ED1

Dec 2002 Revised

Note: Latest version: IEC 60749-18:2019 ED2

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Language English/French

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Abstract

Provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source. Proposes an accelerated annealing test for estimating low dose rate ionizing radiation effects on devices. This annealing test is important for low dose rate or certain other applications in which devices may exhibit significant time-dependent effects. It is intended for military- and space-related applications.

Products specifications

Standard from IEC
Published: December 13 2002
Withdrawn: April 10 2019
Edition: 1
Document type: IS
Pages
ISBN: 2831867436

Publisher: IEC
Distributor: IEC
ICS: 31.080.01
International TC: TC 47

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Revised by: IEC 60749-18:2019 ED2
Revised by: IEC 60749-18:2019 RLV

IEC 60749-18:2002 ED1

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IEC 60749-18:2019 ED2