Standard

IEC 60749-17:2003 ED1

Revised

Note: Latest version: IEC 60749-17:2019 ED2

Existing or new amendments and versions must be purchased separately.

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Abstract

Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

Products specifications

  • Standard from IEC
  • Published:
  • Withdrawn:
  • Edition: 1
  • Document type: IS
  • Pages
  • Publisher: IEC
  • Distributor: IEC
  • ICS: 31.080.01
  • International TC: TC 47

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