Standard

IEC 60747-5-3:1997 ED1

Sep 1997 Replaced

Note: Latest version: IEC 60747-5-3:1997+AMD1:2002 CSV ED1.1

Existing or new amendments and versions must be purchased separately.

Language English/French

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Open product
Amendment 1 - Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods Replaced IEC 60747-5-3:1997/AMD1:2002 ED1 Amendment from Publication date: Mar 2002 Pages: 25 Language: English/French Services: Online, Online + Pdf

Abstract

Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.