Standard

IEC 60512-26-100:2008+AMD1:2011 CSV ED1.1

Current

Existing or new amendments and versions must be purchased separately.

Language
Services

Purchase of a single user license

Reproduction not permitted. Please contact us for license information.

Save up to 20% on new customer discounts on SNV standards subscriptions and multi user licences.

Abstract

IEC 60512-26-100:2008+A1:2011 specifies the test and measurements and the related measurement setup and reference arrangements for interoperability and backward compatibility tests for the development and qualification of 8-way, free and fixed connectors for data transmission. The following test methods are provided:- insertion loss, test 26a;- return loss, test 26b;- near-end crosstalk (NEXT), test 26c;- far-end crosstalk (FEXT), test 26d;- transfer impedance, test 26e;- transverse conversion loss (TCL), test 26f;- transverse conversion transfer loss (TCTL), test 26g.This publication is to be read in conjunction with IEC 60512-1:2001 and IEC 60512-1-100:2006.This consolidated version consists of the first edition (2008) and its amendment 1 (2011). Therefore, no need to order amendment in addition to this publication.

Products specifications

  • Standard from IEC
  • Published:
  • Edition: 1.1
  • Document type: IS
  • Publisher: IEC
  • Distributor: IEC
  • ICS: 31.220.10
  • International TC: TC 48/SC 48B