Search – ICS (International Classification for Standardization)

• 31.080 Semiconductor devices

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• 31.080.01 Semiconductor devices in general
• 31.080.10 Diodes
• 31.080.20 Thyristors
• 31.080.30 Transistors
• 31.080.99 Other semiconductor devices

• Standard

  CLC/TR 62258-4:2013

  Oct 2007 Current
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• Standard

  SN EN 62047-16:2015

  Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 16: Messverfahren zur Ermittlung der Eigenspannungen in Dünnschichten von MEMS-Bauteilen - Substratkrümmungs- und Biegebalken-Verfahren

  Jul 2015 Current
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• Standard

  SN EN 60747-15:2012

  Halbleiterbauelemente - Einzel-Halbleiterbauelemente - Teil 15: Isolierte Leistungshalbleiter

  Mar 2012 Current
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• Standard

  SN EN 60749-21:2011

  Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 21: Lötbarkeit

  Aug 2011 Current
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• Standard

  SN EN IEC 62969-4:2018

  Halbleiterbauelemente - Halbleiterschnittstelle für Automobile - Teil 4: Bewertungsverfahren für Datenschnittstellen bei Automobil-Sensoren

  Aug 2018 Current
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• Standard

  SN EN 60191-3:1999

  Nov 1999 Current
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• Standard

  SN EN 62047-12:2011

  Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 12: Verfahren zur Prüfung der Biege-Ermüdungsfestigkeit von Dünnschichtwerkstoffen unter Verwendung der Resonanzschwingungen bei MEMS-Strukturen

  Oct 2011 Current
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• Standard

  SN EN 62047-10:2011

  Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 10: Druckprüfverfahren an zylinderförmigen Mikroproben für Werkstoffe der Mikrosystemtechnik

  Sep 2011 Current
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• Standard

  SN EN IEC 62969-2:2018

  Halbleiterbauelemente - Halbleiterschnittstelle für Automobile - Teil 2: Verfahren zur Effizienz-Bewertung drahtloser Leistungsübertragung mittels Resonanz bei Automobil-Sensoren

  Apr 2018 Current
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• Standard

  SN EN 62047-26:2016

  Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 26: Beschreibung und Messverfahren für Mikro-Rillen und Nadelstrukturen

  Apr 2016 Current
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